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Identification of Defects in Semiconductors

Publisher: Elsevier Science Publication date: 1998 Publication language: Angielski Number of pages: 393 Publication formats: EAN: 9780080864488 ISBN: 9780080864488 Category: Quantity surveying Publisher's index: 9780080864488 Bibliographic note: -

Description

Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors.The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices,Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded.Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry.

TOC

  • Front Cover 2
  • Identification of Defects in Semiconductors 5
  • Copyright Page 6
  • Contents 7
  • Preface 11
  • List of Contributors 15
  • Chapter 1. EPR and ENDOR Studies of Defects in Semiconductors 17
    • I. Introduction 17
    • II. The EPR/ENDOR Experiment 19
    • III. Theory of EPR and ENDOR 20
    • IV. Additional Examples 32
    • V. Auxiliary Techniques 44
  • Chapter 2. Magneto-Optical and Electrical Detection of Paramagnetic Resonance in Semiconductors 61
    • I. Introduction 61
    • II. Magneto-Optical Detection of EPR and ENDOR 64
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